Join the SENTECH Thin Film Metrology Workshop
Ellipsometry is a high-precision optical metrology technique used to characterise thin films by determining their thickness, refractive index, and optical constants. At its core, ellipsometry quantifies how the polarisation state of light changes when interacting with a film-covered substrate. Spectroscopic Ellipsometry is a broadband optical metrology for thin-film characterisation. This ellipsometry technique analyses polarisation changes…
