Instrument Systems: Comprehensive optical wafer testing for LEDs at a single test station
Efficient, simultaneous testing of thousands of μLEDs on a wafer with a 2D camera system from the LumiTop series. July 2020 – Instrument Systems offers a unique camera-based measurement solution for μLED wafer testing that generates 2-dimensional, pixel-resolved optical analyses within given cycle times. The LumiTop 4000 has a resolution of 12 MP and can…