Join the SENTECH Thin Film Metrology Workshop
Ellipsometry is a high-precision optical metrology technique used to characterise thin films by determining their thickness, refractive index, and optical constants. At its core, ellipsometry quantifies how the polarisation state of light changes when interacting with a film-covered substrate. Spectroscopic Ellipsometry is a broadband optical metrology for thin-film characterisation. This ellipsometry technique analyses polarisation changes across a broad wavelength range, typically spanning the ultraviolet (UV), visible (VIS), and near infrared (NIR) regions. This wavelength-dependent information enables the comprehensive determination of optical constants and thickness, even for complex multilayer structures.
Work directly with the SENTECH application and development experts
Explore how advanced spectroscopic ellipsometry can expand and refine your thin film measurement and characterisation capabilities. Please feel free to bring your non-confidential thin film samples.
Solve Real Sample Challenges with SENTECH Experts
Topics will include measurement workflows, system operation, automation with SpectraRay/4 software, material dispersion analysis, and optical modelling. The workshop is designed for participants of all experience levels, from beginners to advanced users. Take a look at the workshop agenda.
